*ASTM E1476
Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy Read More
State of the Art Imaging & Material Analysis Componentry
Capabilities
Provides magnified images of all manner of objects from 50x to 400,000x
Can identify the elemental composition of materials
Low vacuum capability facilitates analysis of nonconductive or partially conductive samples such as printed circuit boards
2D measurement capability at all magnifications allows precision quality control analysis
Specifications
Variable Pressure Specimen Chamber
Low Vacuum BSE Mode for Sample Charging Mitigation
Chamber Pressure to 4Torr in 25 Millitorr Steps
Hi Vacuum SE Mode for Standard High- Resolution SEM Imaging
Electron Gun: LaB6 Ion Pumped - and Tungsten
Accelerating Voltage: 100volts to 30kV
High Vacuum Image Resolution: 4nm @ 30kV
Low Vacuum Image Resolution: 6nm @ 30kV
Magnification: x10 – x400,000 Secondary Electron Image
Probe Current: 1pA to 5nA Range
TURBO Pumped Specimen Chamber
Robinson BSE Detector
3 Axis Motorized Stage X/Y = 125mm | Z = 100mm ROTATION = 360° Continuous TILT = -5 to +90°
PC Controlled Stage Automation and SEM Control Backscatter Detector
Energy Dispersive Spectrometer (EDS) with state of the art Silicon Drift Detector
SEM (EDS) Testing Standards Conducted by RTI
* ISO/IEC 17025:2017 PJLA Accreditation #128874